Accelerated aging of electronic components
Components undergo an accelerated aging cycle characterized by the type of stress (temperature, pressure, thermal cycling, humidity, etc.), its duration, the measurements made during aging and the intermediate measurements. The component is completely tested at ambient temperature or at several temperatures at T0 (before the start of aging). Then, the components will be removed from the aging oven at regular intervals (for example 200 hours) and will be tested again.
The Life Test provides data on the stability of electric parameters over time so that predictive reliability information for the component can be evaluated and failure modes can be determined.